28 juin 2011 : Participation à la 34ème conférence internationale IEA/AIE (International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems) de Syracuse (États-Unis) du 28 juin au 1 juillet 2011.
Présentation d’une méthodologie permettant d’étudier la diagnosticabilité de défauts de systèmes technologiques pilotés.
Titre : Diagnosability Study of Technological Systems.
Résumé — This paper describes an approach to study the diagnosability of technological systems, by characterizing their observable behaviors. Due to the interaction between many components, faults can occur in a technological system and cause hard damages not only to its integrity but also to its environment. Though a diagnosis system is a suitable solution to detect and identify faults, it is first important to ensure the diagnosability of the system : will the diagnosis system always be able to detect and identify any fault, without any ambiguity, when it occurs ? In this paper, we present an approach to identify and integrate faults in a model of a technological system. Then we use these models for the diagnosability study of faults by characterizing their observable behaviors..
Auteurs : M. BATTEUX*, N. RAPIN+, P. DAGUE§ et P. FIANI*
* Sherpa Engineering, La Garenne Colombes, France (Email : m.batteux@sherpa-eng.com & p.fiani@sherpa-eng.com)
+ CEA LIST, Laboratoire d'Ingénierie dirigée par les modèles pour les Systèmes Embarqués, Point Courier 94, Gif-sur-Yvette, F-91191 France (Email : nicolas.rapin@cea.fr)
§ LRI - Univ Paris 11, Orsay, France (Email : philippe.dague@lri.fr)
